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Orion Astronauts Visit Ames Entry Systems and Technology Divisio
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Orion Astronauts Visit Ames Entry Systems and Technology Divisio

NASA Astronaut Christina Koch, left, holds a test sample for Victor J. Glover to photograph. The sample is a half-inch steel plate with a hole that was drilled by a 12-second burst from a 30kW laser in the Laser Enhanced Arc Jet Facility (LEAF) laboratory, N238.

Date
2025-03-13
Photographer / author
Don Richey
Collection
ARC
Archive
NASA Image and Video Library
Type
photograph

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Reason: a NASA work: not copyrighted in the United States.

Read from: NASA media usage guidelines: NASA material is not copyrighted in the US unless noted; no third-party credit or mark found.

Credit line

"Orion Astronauts Visit Ames Entry Systems and Technology Divisio" (2025-03-13). NASA/ARC/Don Richey. Public domain. https://images.nasa.gov/details/ACD25-0023-030

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